@misc{indiciaebfaf71dbacfc,
  title = {STEM EBIC as a Quantitative Probe of Semiconductor Devices},
  author = {Sebastian Schneider and Sebastian Beckert and René Hammer and Markus König and Grigore Moldovan and Darius Pohl},
  year = {2025},
  url = {https://arxiv.org/abs/2511.11528},
  note = {Source identifier: 2511.11528}
}