TY  - RPRT
TI  - STEM EBIC as a Quantitative Probe of Semiconductor Devices
AU  - Sebastian Schneider
AU  - Sebastian Beckert
AU  - René Hammer
AU  - Markus König
AU  - Grigore Moldovan
AU  - Darius Pohl
PY  - 2025
UR  - https://arxiv.org/abs/2511.11528
ID  - 2511.11528
ER  -