TY  - RPRT
TI  - Variable-temperature attenuator calibration method for on-wafer microwave noise characterization of low-noise amplifiers
AU  - Anthony J. Ardizzi
AU  - Jiayin Zhang
AU  - Akim A. Babenko
AU  - Kieran A. Cleary
AU  - Austin J. Minnich
PY  - 2025
UR  - https://arxiv.org/abs/2511.13619
ID  - 2511.13619
ER  -