TY  - RPRT
TI  - Effect of substrate miscut angle on critical thickness, structural and electronic properties of MBE-grown NbN films on c-plane sapphire
AU  - Anand Ithepalli
AU  - Saumya Vashishtha
AU  - Naomi Pieczulewski
AU  - Qiao Liu
AU  - Amit Rohan Rajapurohita
AU  - Matthew Barone
AU  - Darrell Schlom
AU  - David A. Muller
AU  - Huili Grace Xing
AU  - Debdeep Jena
PY  - 2025
DO  - 10.1063/5.0312575
UR  - https://arxiv.org/abs/2511.13917
ID  - 2511.13917
ER  -