TY  - RPRT
TI  - Reflectivity-based refractive index measurement of van der Waals materials
AU  - Xavier Zambrana-Puyalto
AU  - Alexander Johan Olsen
AU  - Søren Raza
PY  - 2025
UR  - https://arxiv.org/abs/2511.14486
ID  - 2511.14486
ER  -