TY  - RPRT
TI  - Distortion of charge distribution due to internal electric fields described by the drift-diffusion semiconductor model
AU  - Masakazu Yamamoto
PY  - 2026
DO  - 10.1007/s00033-026-02800-1
UR  - https://arxiv.org/abs/2511.16956
ID  - 2511.16956
ER  -