@misc{indiciaef42b670ed2b4,
  title = {Possibilities of the X-ray Diffraction Data Processing Method for Detecting Reflections with Intensity Below the Background Noise Component},
  author = {S. V. Gabielkov and I. V. Zhyganiuk and A. D. Skorbun and V. G. Kudlai and B. S. Savchenko and P. E. Parkhomchuk and S. O. Chikolovets},
  year = {2025},
  doi = {10.1017/s0885715624000241},
  url = {https://arxiv.org/abs/2511.18311},
  note = {Source identifier: 2511.18311}
}