TY  - RPRT
TI  - Predicting the Thermal Behavior of Semiconductor Defects with Equivariant Neural Networks
AU  - Xiangzhou Zhu
AU  - Patrick Rinke
AU  - David A. Egger
PY  - 2025
UR  - https://arxiv.org/abs/2511.18398
ID  - 2511.18398
ER  -