@misc{indiciae2db513581a9d,
  title = {White light interferometry analysis for measuring thin film thickness down to few nanometers},
  author = {Victor Ziapkoff and François Boulogne and Anniina Salonen and Emmanuelle Rio},
  year = {2025},
  url = {https://arxiv.org/abs/2511.21383},
  note = {Source identifier: 2511.21383}
}