TY  - RPRT
TI  - White light interferometry analysis for measuring thin film thickness down to few nanometers
AU  - Victor Ziapkoff
AU  - François Boulogne
AU  - Anniina Salonen
AU  - Emmanuelle Rio
PY  - 2025
UR  - https://arxiv.org/abs/2511.21383
ID  - 2511.21383
ER  -