@misc{indiciae98d3dde86f5a,
  title = {Modelling the Impact of Device Imperfections on Electron Shuttling in SiMOS devices},
  author = {Jack J. Turner and Christian W. Binder and Guido Burkard and Andrew J. Fisher},
  year = {2026},
  doi = {10.1103/hyfp-rmrr},
  url = {https://arxiv.org/abs/2512.03853},
  note = {Source identifier: 2512.03853}
}