TY  - RPRT
TI  - Modelling the Impact of Device Imperfections on Electron Shuttling in SiMOS devices
AU  - Jack J. Turner
AU  - Christian W. Binder
AU  - Guido Burkard
AU  - Andrew J. Fisher
PY  - 2026
DO  - 10.1103/hyfp-rmrr
UR  - https://arxiv.org/abs/2512.03853
ID  - 2512.03853
ER  -