TY  - RPRT
TI  - Characterizing Defect Dynamics in Silicon Carbide Using Symmetry-Adapted Collective Variables and Machine Learning Interatomic Potentials
AU  - Soumajit Dutta
AU  - Cunzhi Zhang
AU  - Gustavo Perez Lemus
AU  - Juan J. de Pablo
AU  - Francois Gygi
AU  - Giulia Galli
AU  - Andrew L. Ferguson
PY  - 2025
UR  - https://arxiv.org/abs/2512.04242
ID  - 2512.04242
ER  -