@misc{indiciaeac358e62d137,
  title = {Investigation of the Physical Mechanism behind Retention Loss in FeFETs with MIFIFIS Gate Structure},
  author = {Tao Hu and Zeqi Chen and Runhao Han and Xinpei Jia and Jia Yang and Mingkai Bai and Ruoyao Ji and Yajing Ding and Mengwei Zhao and Yuhan Li and Kaiyi Li and Wenbo Fan and Xianzhou Shao and Xiaoqing Sun and Kai Han and Jing Zhang and Yanrong Wang and Junshuai Chai and Hao Xu and Xiaolei Wang and Wenwu Wang and Tianchun Ye},
  year = {2025},
  url = {https://arxiv.org/abs/2512.04658},
  note = {Source identifier: 2512.04658}
}