TY  - RPRT
TI  - Quantum Diamond Microscopy for Non-Destructive Failure Analysis of an Integrated Fan-Out Package-on-Package iPhone Chip
AU  - Bartu Bisgin
AU  - Marwa Garsi
AU  - Andreas Welscher
AU  - Michael Hanke
AU  - Fleming Bruckmaier
PY  - 2025
UR  - https://arxiv.org/abs/2512.07619
ID  - 2512.07619
ER  -