TY  - RPRT
TI  - Electrical Characterization of High-k (k>115) Crystalline SrTiO3 (STO) thin film integration with GaN with Nanomembrane Transfer Process
AU  - Md Tahmidul Alam
AU  - Kyoungjun Lee
AU  - Guangying Wang
AU  - Chang-beom Eom
AU  - Chirag Gupta
PY  - 2025
UR  - https://arxiv.org/abs/2512.09391
ID  - 2512.09391
ER  -