@misc{indiciae8866414d5fa9,
  title = {Influence of Radiation and AC Coupling on Time Performance of Analog Pixels Test Structures in 65 nm CMOS technology},
  author = {Gianluca Aglieri Rinella and Luca Aglietta and Matias Antonelli and Francesco Barile and Franco Benotto and Stefania Maria Beole and Elena Botta and Giuseppe Eugenio Bruno and Domenico Colella and Angelo Colelli and Giacomo Contin and Giuseppe De Robertis and Floarea Dumitrache and Domenico Elia and Chiara Ferrero and Martin Fransen and Alessandro Grelli and Hartmut Hillemanns and Isis Hobus and Alex Kluge and Shyam Kumar and Corentin Lemoine and Francesco Licciulli and Bong-Hwi Lim and Flavio Loddo and Esther Mwetaminwa M Bilo and Magnus Mager and Davide Marras and Paolo Martinengo and Cosimo Pastore and Rajendra Nath Patra and Stefania Perciballi and Francesco Piro and Francesco Prino and Luciano Ramello and Felix Reidt and Roberto Russo and Valerio Sarritzu and Umberto Savino and Serhiy Senyukov and Mario Sitta and Walter Snoeys and Jory Sonneveld and Miljenko Suljic and Triloki Triloki and Gianluca Usai and Haakan Wennlof},
  year = {2026},
  url = {https://arxiv.org/abs/2512.13339},
  note = {Source identifier: 2512.13339}
}