TY  - RPRT
TI  - Pulse-Mode Operation and Reliability of BEOL-Compatible Ferroelectric Non-Volatile Capacitive Memories with Amorphous Oxide Semiconductor Channels
AU  - Junmo Lee
AU  - Chengyang Zhang
AU  - Tae-Hyeon Kim
AU  - Suman Datta
AU  - Shimeng Yu
PY  - 2025
UR  - https://arxiv.org/abs/2512.16040
ID  - 2512.16040
ER  -