@misc{indiciaeae1829b134d6,
  title = {Inverted-Mode Scanning Tunneling Microscopy for Atomically Precise Fabrication},
  author = {Eduardo Barrera and Bheeshmon Thanabalasingam and Rafik Addou and Damian Allis and Aly Asani and Jeremy Barton and Tomass Bernots and Brandon Blue and Adam Bottomley and Doreen Cheng and Byoung Choi and Megan Cowie and Chris Deimert and Michael Drew and Mathieu Durand and Tyler Enright and Robert A. Freitas Jr. and Alan Godfrey and Ryan Groome and Si Yue Guo and Sheldon Haird and Aru Hill and Taleana Huff and Christian Imperiale and Alex Inayeh and Jerry Jeyachandra and Mark Jobes and Matthew Kennedy and Robert J. Kirby and Mykhaylo Krykunov and Sam Lilak and Hadiya Ma and Adam Maahs and Cameron J. Mackie and Oliver MacLean and Michael Marshall and Terry McCallum and Ralph C. Merkle and Mathieu Morin and Jonathan Myall and Alexei Ofitserov and Sheena Ou and Ryan Plumadore and Adam Powell and Max Prokopenko and Henry Rodriguez and Sam Rohe and Luis Sandoval and Marc Savoie and Khalil Sayed-Akhmad and Ben Scheffel and Tait Takatani and D. Alexander Therien and Finley Van Barr and Dusan Vobornik and Janice Wong and Reid Wotton and Ryan Yamachika and Cristina Yu and Marco Taucer},
  year = {2025},
  url = {https://arxiv.org/abs/2512.24431},
  note = {Source identifier: 2512.24431}
}