TY  - RPRT
TI  - Application Research of a Deep Learning Model Integrating CycleGAN and YOLO in PCB Infrared Defect Detection
AU  - Chao Yang
AU  - Haoyuan Zheng
AU  - Yue Ma
PY  - 2026
UR  - https://arxiv.org/abs/2601.00237
ID  - 2601.00237
ER  -