TY  - RPRT
TI  - Engineering Ideal 2D Type-II Nodal Line Semimetals via Stacking and Intercalation of van der Waals Layers
AU  - Li Chen
AU  - Junlan Shi
AU  - Jiani Zhang
AU  - Botao Fu
PY  - 2026
UR  - https://arxiv.org/abs/2601.00407
ID  - 2601.00407
ER  -