TY  - RPRT
TI  - Universal Battery Degradation Forecasting Driven by Foundation Model Across Diverse Chemistries and Conditions
AU  - Joey Chan
AU  - Huan Wang
AU  - Haoyu Pan
AU  - Wei Wu
AU  - Zirong Wang
AU  - Zhen Chen
AU  - Ershun Pan
AU  - Min Xie
AU  - Lifeng Xi
PY  - 2025
UR  - https://arxiv.org/abs/2601.00862
ID  - 2601.00862
ER  -