TY  - RPRT
TI  - Analysis of the Optical Properties and Electronic Structure of Semiconductors of the Cu2NiXS4 (X = Si, Ge, Sn) Family as New Promising Materials for Optoelectronic Devices
AU  - Dilshod Nematov
PY  - 2026
DO  - 10.47852/bonviewjopr42021819
UR  - https://arxiv.org/abs/2601.02434
ID  - 2601.02434
ER  -