TY  - RPRT
TI  - Contact resistance and interfacial engineering: Advances in high-performance 2D-TMD based devices
AU  - Xiongfang Liu
AU  - Kaijian Xing
AU  - Chi Sin Tang
AU  - Shuo Sun
AU  - Pan Chen
AU  - Dong-Chen Qi
AU  - Mark B. H. Breese
AU  - Michael S. Fuhrer
AU  - Andrew T. S. Wee
AU  - Xinmao Yin
PY  - 2026
DO  - 10.1016/j.pmatsci.2024.101390
UR  - https://arxiv.org/abs/2601.02628
ID  - 2601.02628
ER  -