@misc{indiciaed19494b23ec7,
  title = {Reliability Modeling of Single-Sided Aluminized Polyimide Films during Storage Considering Stress-Induced Degradation Mechanism Transition},
  author = {Shi-Shun Chen and Dong-Hua Niu and Wen-Bin Chen and Jia-Yun Song and Ya-Fei Zhang and Xiao-Yang Li and Enrico Zio},
  year = {2026},
  doi = {10.1109/tr.2025.3648418},
  url = {https://arxiv.org/abs/2601.08655},
  note = {Source identifier: 2601.08655}
}