TY  - RPRT
TI  - Reliability Modeling of Single-Sided Aluminized Polyimide Films during Storage Considering Stress-Induced Degradation Mechanism Transition
AU  - Shi-Shun Chen
AU  - Dong-Hua Niu
AU  - Wen-Bin Chen
AU  - Jia-Yun Song
AU  - Ya-Fei Zhang
AU  - Xiao-Yang Li
AU  - Enrico Zio
PY  - 2026
DO  - 10.1109/tr.2025.3648418
UR  - https://arxiv.org/abs/2601.08655
ID  - 2601.08655
ER  -