@misc{indiciae213bbc675f58,
  title = {Radiation tolerance tests on key components of the ePIC-dRICH readout card},
  author = {S. Geminiani and B. R. Achari and N. Agrawal and M. Alexeev and C. Alice and R. Ammendola and P. Antonioli and C. Baldanza and L. Barion and A. Biagioni and A. Calivà and M. Capua and F. Capuani and A. Ciardiello and E. Cisbani and M. Chiosso and M. Contalbrigo and F. Cossio and M. Da Rocha Rolo and A. De Caro and D. De Gruttola and G. Dellacasa and D. Falchieri and S. Fazio and O. Frezza and N. Funicello and M. Garbini and N. Jacazio and F. Lo Cicero and A. Lonardo and R. Malaguti and F. Mammoliti and M. Martinelli and M. Mignone and C. Mingioni and M. Nenni and F. Noto and L. Occhiuto and A. Paladino and D. Panzieri and P. Perticaroli and S. Plavully and L. Polizzi and L. Pontisso and R. Preghenella and R. Ricci and L. Rignanese and C. Ripoli and C. Rossi and E. Rovati and N. Rubini and M. Ruspa and A. Saputi and F. Simula and F. Spizzo and U. Tamponi and E. Tassi and G. Torromeo and C. Tuvè and G. M. Urciuoli and S. Vallarino and P. Vicini and R. Wheadon},
  year = {2026},
  doi = {10.1088/1748-0221/21/04/c04039},
  url = {https://arxiv.org/abs/2601.09675},
  note = {Source identifier: 2601.09675}
}