@misc{indiciae2cd27b1381be,
  title = {Towards reliable electrical measurements of superconducting devices inside a transmission electron microscope},
  author = {Joachim Dahl Thomsen and Michael I. Faley and Joseph Vimal Vas and Alexander Clausen and Thibaud Denneulin and Dominik Biscette and Denys Sutter and Peng-Han Lu and Rafal E. Dunin-Borkowski},
  year = {2026},
  doi = {10.1016/j.ultramic.2026.114402},
  url = {https://arxiv.org/abs/2601.13298},
  note = {Source identifier: 2601.13298}
}