TY  - RPRT
TI  - Reducing non-linear effects in Kelvin Probe Force Microscopy of back-gated 2D semiconductors
AU  - Zander Scholl
AU  - Ezra Frohlich
AU  - Natalie Rogers
AU  - Paul Nguyen
AU  - Baker Hase
AU  - Joseph Tatsuro Murphy
AU  - Joel Toledo-Urena
AU  - David Cobden
AU  - Jennifer T. Heath
PY  - 2026
DO  - 10.1063/5.0323880
UR  - https://arxiv.org/abs/2601.14644
ID  - 2601.14644
ER  -