TY  - RPRT
TI  - Quantum Metrology under Coarse-Grained Measurement
AU  - Byeong-Yoon Go
AU  - Geunhee Gwak
AU  - Young-Do Yoon
AU  - Sungho Lee
AU  - Nicolas Treps
AU  - Jiyong Park
AU  - Young-Sik Ra
PY  - 2026
DO  - 10.1364/oe.592671
UR  - https://arxiv.org/abs/2601.16106
ID  - 2601.16106
ER  -