@misc{indiciae981d4ea46387,
  title = {SiMiC: Context-Aware Silicon Microstructure Characterization Using Attention-Based Convolutional Neural Networks for Field-Emission Tip Analysis},
  author = {Jing Jie Tan and Rupert Schreiner and Matthias Hausladen and Ali Asgharzade and Simon Edler and Julian Bartsch and Michael Bachmann and Andreas Schels and Ban-Hoe Kwan and Danny Wee-Kiat Ng and Yan-Chai Hum},
  year = {2026},
  doi = {10.1116/6.0005068},
  url = {https://arxiv.org/abs/2601.17048},
  note = {Source identifier: 2601.17048}
}