TY  - RPRT
TI  - SiMiC: Context-Aware Silicon Microstructure Characterization Using Attention-Based Convolutional Neural Networks for Field-Emission Tip Analysis
AU  - Jing Jie Tan
AU  - Rupert Schreiner
AU  - Matthias Hausladen
AU  - Ali Asgharzade
AU  - Simon Edler
AU  - Julian Bartsch
AU  - Michael Bachmann
AU  - Andreas Schels
AU  - Ban-Hoe Kwan
AU  - Danny Wee-Kiat Ng
AU  - Yan-Chai Hum
PY  - 2026
DO  - 10.1116/6.0005068
UR  - https://arxiv.org/abs/2601.17048
ID  - 2601.17048
ER  -