TY  - RPRT
TI  - Symmetry Adapted Analysis of Screw Dislocation: Electronic Structure and Carrier Recombination Mechanisms in GaN
AU  - Yuncheng Xie
AU  - Haozhe Shi
AU  - Menglin Huang
AU  - Weibin Chu
AU  - Shiyou Chen
AU  - Xin-Gao Gong
PY  - 2026
UR  - https://arxiv.org/abs/2601.19240
ID  - 2601.19240
ER  -