@misc{indiciaef215f741d883,
  title = {Tilt-based Aberration Estimation in Transmission Electron Microscopy},
  author = {Jilles S. van Hulst and Erik M. Franken and Bart J. Janssen and W. P. M. H. Heemels and Duarte J. Antunes},
  year = {2026},
  doi = {10.1016/j.mechatronics.2026.103529},
  url = {https://arxiv.org/abs/2601.20561},
  note = {Source identifier: 2601.20561}
}