@misc{indiciaea5b51818474c,
  title = {TamperBench: Systematically Stress-Testing LLM Safety Under Fine-Tuning and Tampering},
  author = {Saad Hossain and Tom Tseng and Punya Syon Pandey and Samanvay Vajpayee and Matthew Kowal and Nayeema Nonta and Samuel Simko and Stephen Casper and Zhijing Jin and Kellin Pelrine and Sirisha Rambhatla},
  year = {2026},
  doi = {10.1145/3770855.3817557},
  url = {https://arxiv.org/abs/2602.06911},
  note = {Source identifier: 2602.06911}
}