TY  - RPRT
TI  - A stochastic simulation of the dislocation-mediated etching of porous GaN distributed Bragg reflectors
AU  - Piotr Sokolinski
AU  - Ben Thornley
AU  - Zetai Xu
AU  - Thom R. Harris-Lee
AU  - Menno J. Kappers
AU  - Rachel A. Oliver
PY  - 2026
UR  - https://arxiv.org/abs/2602.18336
ID  - 2602.18336
ER  -