TY  - RPRT
TI  - Beam-Offset Thermoreflectance with Bayesian Optimization to Measure the Anisotropic Thermal Properties of Semiconductor Superlattices
AU  - A. Chatterjee
AU  - N. Spitzer
AU  - T. Kruck
AU  - P. Song
AU  - A. Ludwig
AU  - A. D. Wieck
AU  - J. Ordonez-Miranda
AU  - M. Pawlak
PY  - 2026
UR  - https://arxiv.org/abs/2602.18840
ID  - 2602.18840
ER  -