@misc{indiciae6eeb6583cb9e,
  title = {Titanic overconfidence -- dark uncertainty can sink hybrid metrology for semiconductor manufacturing},
  author = {Ronald G. Dixson and Adam L. Pintar and R. Joseph. Kline and Thomas A. Germer and J. Alexander Liddle and John S. Villarrubia and Samuel M. Stavis},
  year = {2026},
  url = {https://arxiv.org/abs/2602.23131},
  note = {Source identifier: 2602.23131}
}