TY  - RPRT
TI  - Defect dependent dynamic nanoindentation hardness of copper up to 25 000 s-1
AU  - Hendrik Holz
AU  - Lalith Kumar Bhaskar
AU  - Tobias Brink
AU  - Dipali Sonowane
AU  - Gerhard Dehm
AU  - James P. Best
AU  - Rajaprakash Ramachandramoorthy
PY  - 2026
DO  - 10.1016/j.matdes.2026.116774
UR  - https://arxiv.org/abs/2603.01845
ID  - 2603.01845
ER  -