@misc{indiciae53e5f937784a,
  title = {Demonstration of Robust Chiral Edge Transport in Field-Induced Chern Insulator MnBi2Te4 Devices with Engineered Geometric Defects},
  author = {Pinyuan Wang and Jun Ge and Jiawei Luo and Xiaoqi Liu and Jiayi Yang and Fucong Fei and Fengqi Song and Jian Wang},
  year = {2026},
  doi = {10.1103/tv3l-85d1},
  url = {https://arxiv.org/abs/2603.03927},
  note = {Source identifier: 2603.03927}
}