TY  - RPRT
TI  - Demonstration of Robust Chiral Edge Transport in Field-Induced Chern Insulator MnBi2Te4 Devices with Engineered Geometric Defects
AU  - Pinyuan Wang
AU  - Jun Ge
AU  - Jiawei Luo
AU  - Xiaoqi Liu
AU  - Jiayi Yang
AU  - Fucong Fei
AU  - Fengqi Song
AU  - Jian Wang
PY  - 2026
DO  - 10.1103/tv3l-85d1
UR  - https://arxiv.org/abs/2603.03927
ID  - 2603.03927
ER  -