TY  - RPRT
TI  - High-resolution resonant inelastic X-ray scattering study of W-L3 edge in WSi2
AU  - Zheqian Zhao
AU  - Shuxing Wang
AU  - Xiyuan Wang
AU  - Yang Su
AU  - Ziru Ma
AU  - Xinchao Huang
AU  - Linfan Zhu
PY  - 2026
DO  - 10.7498/aps.74.20250659
UR  - https://arxiv.org/abs/2603.09561
ID  - 2603.09561
ER  -