@misc{indiciaebc810bbf9385,
  title = {Microstructural Characterization of Nb3Sn Thin Films Using FIB Tomography},
  author = {Eric Viklund and David N. Seidman and Sam Posen},
  year = {2026},
  url = {https://arxiv.org/abs/2603.10472},
  note = {Source identifier: 2603.10472}
}