TY  - RPRT
TI  - Microstructural Characterization of Nb3Sn Thin Films Using FIB Tomography
AU  - Eric Viklund
AU  - David N. Seidman
AU  - Sam Posen
PY  - 2026
UR  - https://arxiv.org/abs/2603.10472
ID  - 2603.10472
ER  -