TY  - RPRT
TI  - Machine Learning-Based Analysis of Critical Process Parameters Influencing Product Quality Defects: A Real-World Case Study in Manufacturing
AU  - Sukumaran Rajasekaran
AU  - Ebru Turanoglu Bekar
AU  - Kanika Gandhi
AU  - Sabino Francesco Roselli
AU  - Mohan Rajashekarappa
PY  - 2026
UR  - https://arxiv.org/abs/2603.11666
ID  - 2603.11666
ER  -