@misc{indiciaef3305d56830a,
  title = {RASP: Reliability ab initio simulation package of MOSFETs based on all-state model},
  author = {Xinjing Guo and Menglin Huang and Shiyou Chen},
  year = {2026},
  url = {https://arxiv.org/abs/2603.12042},
  note = {Source identifier: 2603.12042}
}