TY  - RPRT
TI  - RASP: Reliability ab initio simulation package of MOSFETs based on all-state model
AU  - Xinjing Guo
AU  - Menglin Huang
AU  - Shiyou Chen
PY  - 2026
UR  - https://arxiv.org/abs/2603.12042
ID  - 2603.12042
ER  -