@misc{indiciae42113e424e4d,
  title = {Imaging the high-frequency charging dynamics of a single impurity in a semiconductor on the atomic scale},
  author = {Maialen Ortego Larrazabal and Jiasen Niu and Stephen R. McMillan and Paul M. Koenraad and Michael E. Flatté and Milan P. Allan and Ingmar Swart},
  year = {2026},
  url = {https://arxiv.org/abs/2603.13040},
  note = {Source identifier: 2603.13040}
}