TY  - RPRT
TI  - Imaging the high-frequency charging dynamics of a single impurity in a semiconductor on the atomic scale
AU  - Maialen Ortego Larrazabal
AU  - Jiasen Niu
AU  - Stephen R. McMillan
AU  - Paul M. Koenraad
AU  - Michael E. Flatté
AU  - Milan P. Allan
AU  - Ingmar Swart
PY  - 2026
UR  - https://arxiv.org/abs/2603.13040
ID  - 2603.13040
ER  -