TY  - RPRT
TI  - Ab Initio Transfer Length Method Simulations of Tunneling Limits in 2D Semiconductors
AU  - Tae Hyung Kim
AU  - Juho Lee
AU  - Yong-Hoon Kim
PY  - 2026
UR  - https://arxiv.org/abs/2603.14296
ID  - 2603.14296
ER  -